Virtual-WDS©

Wavelength-dispersive electron microprobe analysis simulation on your PC!

This product developed by Stephen Reed & Andy Buckley of Cambridge University, is an absolute must for all of those engaged in electron microprobe analysis and using conventional wavelength Dispersive Analysis. The spectra that are to be anticipated are simulated on the computer, allowing superior choices to be made for both analytical lines and background positions. Interfering lines can be seen at a glance - and therefore time-wasting and potentially costly errors can be easily avoided.

WD spectra recorded with TAP, PET or LiF crystals (+ PC1 multilayer) for samples of any composition can be displayed on-screen using a database of experimental pure-element spectra. Background measuring positions can be selected in order to minimise the effect of neighbouring lines, and the size of any interferences may be estimated. Peak and background intensities for given accelerating voltage and current can be predicted and used to produce estimates of analytical precision and detection limits. Counting times required in any particular case can thus be determined in advance, thereby saving the instrument time otherwise used in a 'trial and error' approach.

Downloadable demo version available at:
http://www.esc.cam.ac.uk/astaff/buckley/vwds1.html
Further information from: sjbr@esc.cam.ac.uk

Virtual-WDS© System Requirements